Thursday, April 18, 2013

Si and SiGe Nanowires: Fabrication Process and Thermal Conductivity Measurement by 3ω-Scanning Thermal Microscopy

Stéphane Grauby, Etienne Puyoo, Jean-Michel Rampnoux, Emmanuelle Rouvière and Stefan Dilhaire



TOC Graphic


The Journal of Physical Chemistry C

DOI: 10.1021/jp4018822






Link to full article
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