Tuesday, April 23, 2013

Electrical tip-sample contact in scanning conductive torsion mode

(author unknown)



Stefan A. L. Weber and Rüdiger Berger

We investigated the nature of the mechanical and the electrical tip-sample contact in scanning conductive torsion mode microscopy (SCTMM). Experiments on the soft conducting polymer blend of poly(3,4-ethylenedioxythiophene) poly(styrenesulfonate) demonstrated that the tip-sample force and thus the ... [Appl. Phys. Lett. 102, 163105 (2013)] published Tue Apr 23, 2013.



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